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Yield and Variability Optimization of Integrated Circuits by M.A. Styblinski (En
- Item No : 146702904123
- Condition : Brand New
- Brand : No brand Info
- Seller : the_nile
- Current Bid : US $132.76
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* Item Description
- By M.A. Styblinski, Jian Cheng Zhang. 1 Introduction. - 1.1 Design for Quality and Manufacturability. - 1.2 Notation. - 1.3 Interpretation of Basic Concepts. - 1.4 Summary. - 2 Overview of IC Statistical Modeling.
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