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Yield and Reliability in Microwave Circuit and System Design, Hardcover by Meehan, Michael D.; Purviance, John, ISBN 0890065276, ISBN-13 9780890065273, Brand New, Free shipping in the US Advocates the proactive use of Monte Carlo methods in the computer-aided design of microwave circuits and systems. A discussion and presentation of ideas and arguments, rather than an encyclopedia of solutions. Addressed to design engineers just beginning to use statistical design and analysis, and to engineering managers who want to evaluate the benefits of applying them in a particular context. Annotation copyright Book News, Inc. Portland, Or.
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