When you click on links to various merchants on this site and make a purchase, this can result in this site earning a commission. Affiliate programs and affiliations include, but are not limited to, the eBay Partner Network.
Vlsi Fault Modeling and Testing Techniques, Hardcover by Zobrist, George W. (...
- Item No : 197257996347
- Condition : Brand New
- Brand : No brand Info
- Seller : superbookdeals1
- Current Bid : US $125.44
-
* Item Description
- Vlsi Fault Modeling and Testing Techniques, Hardcover by Zobrist, George W. (EDT), ISBN 0893917818, ISBN-13 9780893917814, Brand New, Free P&P in the UK Inaugurates a new Ablex series covering the state-of-the-art in various aspects of VLSI testing, fault modeling, environments, routing and placement, and logic design. Among the topics addressed in the present text are physical fault modeling and simulation for VLSI MOS circuits; designing CMOS gates to test open faults; testing bridging faults in VLSI; and testable design synthesis methods. Annotation copyright Book News, Inc. Portland, Or.
★ Recommended Products Related To This Item
♥ Best Selling Products in this category
-
- The Lost Super Foods
- $ 37.00
- The Self-Sufficient Backyard
- $ 37.00
- A Navy Seals BUG IN GUIDE
- $ 39.00
- Childrens Books Phonics Lot 60
- $ 34.99
