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    Test Pattern Generation using Boolean Proof Engines by Rolf Drechsler (English)

    • Item No : 146752375160
    • Condition : Brand New
    • Brand : No brand Info
    • Seller : the_nile
    • Current Bid : US $146.08

    • * Item Description

    • By Rolf Drechsler, Daniel Tille, Stephan Eggersglüß, Görschwin Fey. After producing a chip, the functional correctness of the integrated circuit has to be checked. Many algorithms for "Automatic Test Pattern Generation" (ATPG) have been proposed in the last 30 years.
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