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Other important topics including Transmission Electron Microscopy (TEM) and Atomic Force Microscopy (AFM) are also covered. Covers significant advances in the technological aspects and applications of spectroscopic and microscopic techniques used in the Earth and Materials Sciences.
When you click on links to various merchants on this site and make a purchase, this can result in this site earning a commission. Affiliate programs and affiliations include, but are not limited to, the eBay Partner Network.