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Semiconductor Device and Failure Analysis : Using Photon Emission Microscopy,...
- Item No : 357260434280
- Condition : Like New
- Brand : No brand Info
- Seller : greatbookprices1
- Current Bid : US $225.36
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* Item Description
- The continuing miniaturization and increasing complexity of semiconductor integrated circuits in microelectronics pose new challenges in physical fault detection. Includes PEM images and schematic diagrams.
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