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Noia - Design-for-Test and Test Optimization Techniques for TSV-based - L555z
- Item No : 386995510620
- Condition : Brand New
- Brand : NA
- Seller : ihaveit_music
- Current Bid : US $136.98
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* Item Description
- The Title is Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs. Pages Count - 264. Binding type - Hardcover. This is a great Christmas gift idea. Books are released in many editions and variations, such as standard edition, re-issue, not for sale, promotional, special edition, limited edition, and many other editions and versions.
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