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    Introduction to Surface Analysis by XPS and AES, Hardcover by Watts, John F.;...

    • Item No : 405838988617
    • Condition : Like New
    • Brand : No brand Info
    • Seller : superbookdeals1
    • Current Bid : US $72.91

    • * Item Description

    • Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling.
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