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Introduction to Semiconductor Device Yield Modeling, Hardcover by Ferris-Prabhu, Albert V., ISBN 0890064504, ISBN-13 9780890064504, Like New Used, Free shipping in the US For engineers designing semiconductor devices who are new to predicting their creation's yield. Discusses the need for accurate yield predictions in the context of fabrication processes and defects that lower yield; calculating the probability that a potentially fatal defect will indeed be so; counting the number of ways in which events can be distributed over all possible states when their occurrence is governed by different distribution laws, and other topics. Annotation copyright Book News, Inc. Portland, Or.
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