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Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach (Paperback or Softback). ISBN: 9780367400972. Your source for quality books at reduced prices. Condition Guide.
When you click on links to various merchants on this site and make a purchase, this can result in this site earning a commission. Affiliate programs and affiliations include, but are not limited to, the eBay Partner Network.