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    Hierarchical Modeling for VLSI Circuit Testing by Debashis Bhattacharya (English

    • Item No : 146570702106
    • Condition : Brand New
    • Brand : No brand Info
    • Seller : the_nile
    • Current Bid : US $132.31

    • * Item Description

    • By Debashis Bhattacharya, John P. Hayes. Hierarchical Modeling for VLSI Circuit Testing. Short Title HIERARCHICAL MODELING FOR VLSI. 1 Introduction. - 1.1 Background. - 1.2 Prior Work. - 1.3 Outline.
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