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    Focused Ion Beam Systems: Basics and Applications by Nan Yao (English) Hardcover

    • Item No : 395963020269
    • Condition : Brand New
    • Brand : No brand Info
    • Seller : grandeagleretail
    • Current Bid : US $181.20

    • * Item Description

    • Focused Ion Beam Systems by Nan Yao. Author Nan Yao. The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool.
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