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    Focused Ion Beam Systems: Basics and Applications by Nan Yao [Hardback]

    • Item No : 187235673320
    • Condition : Brand New
    • Brand : No brand Info
    • Seller : simplybestprices-10to20dayshipping
    • Current Bid : US $97.10

    • * Item Description

    • The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool.
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