When you click on links to various merchants on this site and make a purchase, this can result in this site earning a commission. Affiliate programs and affiliations include, but are not limited to, the eBay Partner Network.
Design and Test Techniques for Very Large Scale Integration and Wafer Scale Inte
- Item No : 156856791379
- Condition : Good
- Brand : No brand Info
- Seller : webuybooks
- Current Bid : US $6.33
-
* Item Description
- Design and Test Techniques for Very Large Scale Integration and Wafer Scale Integration (IEE computing series). Dust cover is intact and pages are clean and not marred by notes. Item may contain remainder marks on outside edges.
★ Recommended Products Related To This Item
-
- Wafer Scale Integration
- $ 171.59
♥ Best Selling Products in this category
-
- The Lost Super Foods
- $ 37.00
- The Self-Sufficient Backyard
- $ 37.00
- A Navy Seals BUG IN GUIDE
- $ 39.00
- Childrens Books Phonics Lot 60
- $ 34.89
