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Design and Test Techniques for Very Large Scale Integration and Wafer Scale Inte
- Item No : 156856791379
- Condition : Good
- Brand : No brand Info
- Seller : webuybooks
- Current Bid : US $5.70
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* Item Description
- Design and Test Techniques for Very Large Scale Integration and Wafer Scale Integration (IEE computing series). Dust cover is intact and pages are clean and not marred by notes. Item may contain remainder marks on outside edges.
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