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Design, Analysis and Test of Logic Circuits Under Uncertainty by Smita Krishnasw
- Item No : 136229078976
- Condition : Brand New
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- Seller : the_nile
- Current Bid : US $132.02
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* Item Description
- By Smita Krishnaswamy, Igor L. Markov, John P. Hayes. Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling.
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