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  • Delay Fault Testing for VLSI Circuits by Angela Krstic (English) Paperback Book

    • Item No : 146577210949
    • Condition : Brand New
    • Brand : No brand Info
    • Seller : the_nile
    • Current Bid : US $186.94
    • * Item Description

    • We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. This puts significant demands on timing analysis and delay testing. The authors of this book, Angela Krstic and Tim Cheng, have personally contributed to this research.
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