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    Defects and Properties of Semiconductors: Defect Engineering by J. Chikawa (Engl

    • Item No : 157161063640
    • Condition : Brand New
    • Brand : No brand Info
    • Seller : the_nile
    • Current Bid : US $97.48

    • * Item Description

    • By J. Chikawa, K. Sumino, K. Wada. Edited by J. Chikawa. Recently, a new trend has appeared in which crystal defects are positively utilized to improve the device performance and reliability. A typical example is the intrinsic gettering technique for Czochralski silicon.
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