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Defect and Fault Tolerance in VLSI Systems: Volume 1 by Israel Koren (English) P
- Item No : 146576961161
- Condition : Brand New
- Brand : No brand Info
- Seller : the_nile
- Current Bid : US $131.00
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* Item Description
- 1 Yield Models for Defect-Tolerant VLSI Circuits: A Review. - 3 Models for Defects and Yield. - Defects, Faults and Semiconductor Device Yield. - On the Probability of Fault Occurrence. - A New Yield Formula for Fault-Tolerant Large Area Devices.
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