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    Defect Complexes in Semiconductor Structures: Proceedings of the International S

    • Item No : 157159654069
    • Condition : Brand New
    • Brand : No brand Info
    • Seller : the_nile
    • Current Bid : US $133.04

    • * Item Description

    • A technologist's view on defects. - Characterization of impurities and defects by electron paramagnetic resonance and related techniques. - Review of the possibilities of electron microscopy in the identification of defect structures.
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