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    Cluster Secondary Ion Mass Spectrometry: Principles and Applications by Christin

    • Item No : 236087755828
    • Condition : Brand New
    • Brand : No brand Info
    • Seller : the_nile_uk_store
    • Current Bid : US $182.13

    • * Item Description

    • It works by using a cluster ion source to sputter desorb material from a solid sample surface. In addition, each chapter ends with a detailed reference set to the primary literature, facilitating further research into individual topics where desired.
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