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Characterization of High Tc Materials and Devices by Electron... - 9780521031707
- Item No : 317074274522
- Condition : Brand New
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- Seller : books--etc
- Current Bid : US $57.27
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* Item Description
- ISBN-13: 9780521031707, 978-0521031707. This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.
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