• Shop by category
  • Powered by eBay

    • When you click on links to various merchants on this site and make a purchase, this can result in this site earning a commission. Affiliate programs and affiliations include, but are not limited to, the eBay Partner Network.

    Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques by Bharat

    • Item No : 157155779928
    • Condition : Brand New
    • Brand : No brand Info
    • Seller : the_nile
    • Current Bid : US $178.08

    • * Item Description

    • By Bharat Bhushan, Harald Fuchs, Satoshi Kawata. Integrated Cantilevers and Atomic Force Microscopes. - Electrostatic Microscanner. - High-Frequency Dynamic Force Microscopy. - Torsional Resonance Microscopy and Its Applications.
    ★ Recommended Products Related To This Item
    ♥ Best Selling Products in this category
  • BEAUTY
  • Skin Care
  • Makeup
  • Nail Care, Manicure & Pedicure
  • Hair Care & Styling
  • FASHION
  • Men's Clothing
  • Men's Shoes
  • Women's Clothing
  • Women's Handbags & Bags
  • Jewelry & Watches
  • KID'S
  • HOME & GARDEN
  • Kitchen, Dining & Bar
  • Home Decor
  • Home Improvement
  • Food & Beverages
  • ELECTRONICS
  • Cell Phones & Accessories
  • Cameras & Photo
  • Computers/Tablets & Networking
  • Consumer Electronics
  • ENTERTAINMENT
  • Music
  • Entertainment Memorabilia
  • DVDs & Movies
  • MORE
  • Sporting Goods
  • Motors
  • Business & Industrial
  • Toys & Hobbies


    • Contact Us

    When you click on links to various merchants on this site and make a purchase, this can result in this site earning a commission. Affiliate programs and affiliations include, but are not limited to, the eBay Partner Network.