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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and
- Item No : 156835419249
- Condition : Brand New
- Brand : No brand Info
- Seller : the_nile
- Current Bid : US $145.20
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* Item Description
- While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. While providing a brief overview of the principles of SIMS, the book also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties.
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