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An Introduction to Surface Analysis by XPS and AES by John F. Watts (English) Ha
- Item No : 396826430285
- Condition : Brand New
- Brand : No brand Info
- Seller : grandeagleretail
- Current Bid : US $102.08
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* Item Description
- Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling.
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