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  • Advances in the Crystallographic and Microstructural Analysis of Charge Density

    • Item No : 157163056413
    • Condition : Brand New
    • Brand : No brand Info
    • Seller : the_nile
    • Current Bid : US $74.23
    • * Item Description

    • Concluding Remarks. Selected Area Diffraction. Convergent Beam Diffraction. High Resolution Electron Microscopy. Point Defects in CDW Materials. CDW in the Presence of Defects. Structural Variations in the Pinned CDW.
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