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Advanced Mathematical and Computational Tools in Metrology and Testing : Amct...
- Item No : 365759830405
- Condition : Like New
- Brand : No brand Info
- Seller : greatbookprices1
- Current Bid : US $218.37
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* Item Description
- Advanced Mathematical and Computational Tools in Metrology and Testing : Amctm VIII, Hardcover by Pavese, Franco (EDT); Ber, Markus (EDT); Forbes, Alistair B. (EDT), ISBN 9812839518, ISBN-13 9789812839510, Like New Used, Free shipping in the US
Metrologists, mathematicians, and software and information-technology engineers share insights into the modeling, statistical, and computational requirements in metrology and testing. One goal is to encourage young researchers; another is to promote collaboration in the context of European Union and other regional and international programs and projects. Among the 56 discussions are methods for estimating the effect of correlation at the measurement of alternating voltages, the virtual atomic force microscope as a tool for nano-metrology, an approach to uncertainty using nested analysis, applying quality-by-design to analytical methods in the pharmaceutical industry, the propagation of uncertainty related to the calibration functions of platinum-resistance thermometers and possible correlation effects, and optimal decision rules and limits of detection. Only authors are indexed. Annotation ©2009 Book News, Inc., Portland, OR ()
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