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    Advanced Materials Characterization: Basic Principles, Novel Applications, and F

    • Item No : 157203473574
    • Condition : Brand New
    • Brand : No brand Info
    • Seller : the_nile
    • Current Bid : US $71.42

    • * Item Description

    • Introduction to material characterization 2. X-Ray Diffraction (XRD) 3. Scanning electron microscope (SEM) 6. Field emission scanning electron microscope (FESEM) 7. Transmission electron microscope (TEM) 8.
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